Session Presentations
| Presentation Title | Author(s) | Download |
|---|---|---|
| ATE and TPS Management |
Julie Altham (Warner Robins Air Logistics Center, US Air Force, USA); John Stabler (Warner Robins Air Logistics Center, US Air Force, USA); Betty Spofford (Warner Robins Air Logistics Center, US Air Force, USA); Phong Do (Warner Robins Air Logistics Center, US Air Force, USA) |
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| Modernizing a DoD ATS Family - Part II |
Marty Reagan (NAVAIR PMA260 & Eagle Systems Inc., USA) |
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| Future Logistics Approaches |
Betty Spofford (Warner Robins Air Logistics Center, US Air Force, USA); Julie Altham (Warner Robins Air Logistics Center, US Air Force, USA); John Stabler (Warner Robins Air Logistics Center, US Air Force, USA) |
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| Presentation Title | Author(s) | Download |
|---|---|---|
| The Vector Network Analyzer - An Essential Tool in Modern ATE Measurements |
Anthony Estrada (AE Systems, USA) |
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| Rapid Development and Porting of New Waveforms for Synthetic Instrumentation |
Charna Parkey (Astronics, DME Corporation & University of Central Florida, USA) |
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| Scalable Benchtop Test System Applying IEEE P1693 MIPSS Standard |
Michael J Stora (System Interconnect Technologies, USA); Richard Freeman (Lockheed Martin Simulation, Training & Support, USA); Byron James (IE Test Systems, USA) |
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| Presentation Title | Author(s) | Download |
|---|---|---|
| Relays Fail, Test Systems Don't Have To |
Jordan A. Dolman (National Instruments, USA); Luke Schreier (National Instruments, USA) |
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| Common RF Test Platform |
Richard Hooper (AAI Corporation, USA); David Savage (AAI, USA) |
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| The Development of a Business Case Template for Organizational-Level Testers |
Mel Hocker (USAF, USA); Virginia Slay (USAF, USA) |
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| Presentation Title | Author(s) | Download |
|---|---|---|
| System Design of a C-17 Radome Test Station |
Peter Bryant (Mercer University Engineering Research Center, USA); Tracy Tillman (Mercer University Engineering Research Center, USA) |
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| Mobile Power Issues with Test Equipment; ATS |
Elizabeth DePuy (Air Force & WR-ALC, USA) |
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| Presentation Title | Author(s) | Download |
|---|---|---|
| Analyzing Artifacts in the Time Domain Waveform to Locate Wire Faults |
Charna Parkey (Astronics, DME Corporation & University of Central Florida, USA); Craig Hughes (Astronics, DME Corporation, USA); Nicholas Locken (Astronics, AES Corporation, USA) |
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| Automated Fiber Optic Cable End Face Field Inspection Technology |
Abhijit Bhoite (Impact Technologies LLC, USA); Nikhil Beke (Impact Technologies LLC, USA); Timothy Duffy (Impact Technologies LLC, USA); Michael Moore (Impact Technologies LLC, USA); Myra Torres (Impact Technologies LLC, USA) |
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| On-line Intermittent Connector Anomaly Detection |
Antonio E Ginart (Impact Technologies, LLC, USA); Irfan Ali (Impact Technologies, LLC, USA); Jonathan Goldin (Impact Technologies, LLC, USA); Irtaza Barlas (Impact Technologies, USA); Patrick W Kalgren (Impact Technologies, LLC, USA); Michael J Roemer (Impact Technologies, LLC, USA); Edward Balaban (NASA, USA) |
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| Presentation Title | Author(s) | Download |
|---|---|---|
| Signal Based Domain Specific Language (SBDSL)- A Proposal for a Next Generation Test Language |
Michael Bodkin (Lockheed Martin Global Training and Logistics, USA); Joe Headrick (Lockheed Martin STS, USA); Robert R Fox (US Navy, USA); Timothy W Davis (NAVAIR, USA); Kevin Dusch (NAVAIR, USA); Dan Wolfe (NAVAIR, USA) |
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| Where Did My Signal Go? A Discussion of Signal Loss between the ATE and UUT |
Tushar Gohel (Teradyne, USA) |
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| Polymorphic Analog Instrument Environment |
David Lind (Teradyne, Inc., USA) |
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| Presentation Title | Author(s) | Download |
|---|---|---|
| TPS Development using the Microsoft .NET Framework |
Teresa P Lopes (Teradyne, USA); Yonet A Eracar (Teradyne, Inc., USA) |
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| Why did we add LabVIEW applications to our ATLAS TPSs? |
Larry V. Kirkland (WesTest Engineering, USA) |
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| Comparing Software Design for Testability to Hardware DFT and BIST |
Jack Alanen (California State University, Northridge & ATE Solutions, Inc, USA); Louis Y. Ungar (A.T.E. Solutions, Inc., USA) |
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| Presentation Title | Author(s) | Download |
|---|---|---|
| Capacitive Transducer for Condition Based Maintenance After Harsh Landing Events |
Oliver Tivadar Sagi (Budapest University of Technology and Economics, Hungary); David Maynard (University of Arizona, USA); Eniko Enikov (University of Arizona, USA) |
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| Anecdotal Experiences on the Value of Limited Environmental Testing for the Analysis of "No Fault Found" Units |
Raymond White (Hill AFB, USA); Brian Richardson (Hill AFB, USA) |
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| Presentation Title | Author(s) | Download |
|---|---|---|
| Broadband PXI Local Oscillator Modules with Low Phase Noise and Fast Switching Speed |
Alexander Chenakin (Phase Matrix, Inc., USA); Suresh Ojha (Phase Matrix, Inc., USA); Shyam Nediyanchath (Phase Matrix, Inc., USA); Vladimir Bykhovsky (Phase Matrix Inc., USA); Steven McClellan (Phase Matrix, Inc., USA); Hue Ngo (Phase Matrix, Inc., USA) |
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| A Subsystem that Behaves as an LXI Instrument |
Brandon Thorpe (Teradyne, Inc., USA) |
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| Creating Test Systems using AXIe and PXI Modules |
Creating Test Systems using AXIe and PXI Modules |
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| Presentation Title | Author(s) | Download |
|---|---|---|
| Next Generation Test System Architectures for Depot and O-Level Test |
Michael J Dewey (Geotest - Marvin Test Systems, USA); James Ginn (DME / Astronics, USA) |
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| The Impact of Test Instrumentation with Distributed Processing Capabilities on Test Program Set (TPS) Architecture and Development |
Michael McGoldrick (Teradyne, Inc, USA) |
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| Using General Purpose Digital Hardware to Perform Boundary Scan Tests |
Terry Borroz (Teradyne, Inc., USA) |
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| Presentation Title | Author(s) | Download |
|---|---|---|
| Testable and Diagnosable Commercial off the Shelf (COTS) Electronics |
Louis Y. Ungar (A.T.E. Solutions, Inc., USA) |
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| Building Hardware-In-The-Loop Communication Test Channels |
Mark Lombardi (RT Logic, USA) |
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| Presentation Title | Author(s) | Download |
|---|---|---|
| Multiple Model Moving Horizon Estimation Approach to Prognostics in Coupled Systems |
Bharath Pattipati (University of Connecticut & Systems & Optimization Lab, USA); Chaitanya Sankavaram (University of Connecticut, USA); Krishna Pattipati (University of Connecticut, USA); Yilu Zhang (General Motors R&D Center, USA); Mark Howell (General Motors Company, USA); Mutasim Salman (General Motors Research, USA) |
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| Presentation Title | Author(s) | Download |
|---|---|---|
| Proposed System for Automating Electrical Verification and Validation of Spacecraft Liquid | View | |
| An In-Depth Look at the Radio Frequency Ground Support Equipment for the Radiation Belt Storm Probes Mission |
Judy Bitman (JHU / APL, USA) |
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| Presentation Title | Author(s) | Download |
|---|---|---|
| Demonstrating the Capabilities of IEEE SIMICA Standards in Support of the DoD ATS Framework in a Net-centric Maintenance Environment |
Joseph J Stanco (Support Systems Assoc. Inc., USA); Mukund Modi (NAVAIR, USA) |
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| Automation Hooks Architecture for Flexible Test Orchestration - Concept Development and Validation |
Chatwin Lansdowne (NASA, USA); John Maclean (METECS, USA); Christopher Winton (METECS, USA); Patrick McCartney (METECS, USA) |
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| Presentation Title | Author(s) | Download |
|---|---|---|
| System Models Effect on Test Integration Cost |
Hugh A. Pritchett (Analysis Integration & Design Inc. (AIDI), USA) |
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| A Practical Use for ATML Capabilities |
Chris C Gorringe (Cassidian Test Engineering Services Ltd., United Kingdom); Teresa P Lopes (Teradyne, USA); Dan Pleasant (Agilent Technologies, USA) |
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| Supporting a Family of Test Program Languages using a Single Open Markup Language |
Steve Wegener (The Boeing Company, USA) |
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| Presentation Title | Author(s) | Download |
|---|---|---|
| Research on Features for Diagnostics of Filtered Analog Circuits Based on LS-SVM |
Bing Long (University of Electronic Science and Technology of China, P.R. China); Shulin Tian (University of Electronic Science and Technology of China, P.R. China); Qiang Miao (University of Electronic Science and Technology of China, P.R. China); Michael Pecht (University of Maryland, USA) |
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| Modeling of Jitter and its Effects on Time Interleaved ADC Conversion |
Charna Parkey (Astronics, DME Corporation & University of Central Florida, USA); David Chester (Harris Corporation, USA); Matthew T. Hunter (ZTEC Instruments & University of Central Florida, USA); Wasfy Mikhael (University of Central Florida, USA) |
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| Presentation Title | Author(s) | Download |
|---|---|---|
| DoD/MOD Coalition Efforts for ATS |
Mike Malesich (NAVAIR, USA); Malcolm Brown (UK MoD, United Kingdom) |
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| CASS Family TPS Support Toolset |
Gilberto Garcia (Fleet Readiness Center Southeast (FRCSE), USA); Robert Loe (NAVAIR, Jacksonville, FL, USA); Brad Bravo (DOD, USA); Jose Cifredo (DoD, USA) |
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| A Methodology for Enhancing Legacy TPS/ATS Sustainability via Employing Synthetic Instrumentation Technology |
David R Carey (US Army & Tobyhanna Army Depot, USA); Robert Wade Lowdermilk (BAE Systems, USA); Alexis Allegra (BAE Systems, USA); Christopher Antall (Tobyhanna Army Depot, |
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| Presentation Title | Author(s) | Download |
|---|---|---|
| The Economics of Diagnostics and Repair in Development, Production and Support |
Duane Lowenstein (Agilent Technologies, USA) |
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| Logistics Challenges with COTS Dominated Army ATE |
Patrick Curry (PD TMDE & US Army, USA); Joseph Cuccaro (US Army RDECOM, USA) |
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| 21st Century Strategies for Minimizing Cost of Test Ownership while Maximizing Availability and Technology Refresh for Test and Measurement Assets |
Tanya Jamison (ElectroRent, USA); Duane Lowenstein (Agilent Technologies, USA) |
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| Presentation Title | Author(s) | Download |
|---|---|---|
| Remote Automatic Test Equipment Software Management - Information Assurance Vulnerability Alert Management |
Craig Koepping (NAVAIR, USA); Paul Rajcok (NAVAIR, USA); Christopher Yoon (NAVAIR, USA) |
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| V-22 Aircraft Flight Data Mining |
Christopher Jaworowski (NAVAIR Lakehurst, USA); Robert J Meseroll (NAVAIR Lakehurst, USA); Michael Burger (NAVAIR, USA) |
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| Solderless Fault Insertion Test Set to Enhance ATE Operator Training |
Christopher P Heagney (US Naval Air Systems Command, USA) |
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Dates and Locations
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Sep122011
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Sep102012
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